Keithley 2308: Precision Source-Measure Unit for Advanced Device Characterization

Keithley 2308: The Precision Source Measure Unit for Demanding Applications

The Keithley 2308 is a high-performance source measure unit (SMU) designed for precision characterization and testing of electronic devices. With its exceptional accuracy, wide measurement range, and advanced features, the 2308 empowers engineers and researchers to push the boundaries of innovation.

Product Specifications:

Voltage Source: 0 to 100 V, 100 mA
Current Source: 0 to 100 mA, 100 V
Voltage Measurement: 10 nV to 100 V, 10 fA to 100 mA
Current Measurement: 10 fA to 100 mA, 10 nV to 100 V

Features and Benefits:

High Accuracy and Resolution: The 2308 delivers industry-leading accuracy of 0.01% and resolution of 10 nV/10 fA, ensuring precise and reliable measurements.
Wide Measurement Range: Its extended voltage and current ranges allow for characterization of a broad spectrum of devices, from low-power semiconductors to high-voltage power electronics.
Advanced Pulse Measurement: The 2308’s pulse measurement capabilities enable precise characterization of transient behavior, making it ideal for testing power devices and energy storage systems.
Intuitive User Interface: The intuitive front panel and powerful software interface simplify operation, reducing setup time and improving productivity.
Remote Control and Automation: The 2308 supports remote control via GPIB, USB, and Ethernet, enabling seamless integration into automated test systems.

Accelerating Innovation: Its precision and versatility empower engineers to develop and test cutting-edge devices with confidence.
Improving Productivity: The intuitive interface and automation capabilities streamline testing processes, saving time and resources.
Ensuring Reliability: The 2308’s high accuracy and robust design ensure reliable and repeatable measurements, reducing the risk of errors and costly rework.

With its unparalleled performance and value, the Keithley 2308 is the ideal choice for demanding applications in semiconductor characterization, power electronics testing, and advanced research.